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US Patent Issued to Schneider Electric (China) on June 23 for "Reset module for handle mechanism, handle mechanism and switching device" (Chinese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,152, issued on June 23, was assigned to Schneider Electric (China) Co. Ltd. (Beijing). "Reset module for handle mechanism, handle mechanism... Read More


US Patent Issued to Meta Platforms on June 23 for "Screw type panel mount fuse holder lock out device" (Ohio Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,153, issued on June 23, was assigned to Meta Platforms Inc. (Menlo Park, Calif.). "Screw type panel mount fuse holder lock out device" was ... Read More


US Patent Issued to Korea Research Institute of Standards and Science on June 23 for "Electron gun using virtual source method" (South Korean Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,154, issued on June 23, was assigned to Korea Research Institute of Standards and Science (Daejeon, South Korea). "Electron gun using virtu... Read More


US Patent Issued to Bourns on June 23 for "Surface mount electrical devices and methods" (Texas Inventor)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,155, issued on June 23, was assigned to Bourns Inc. (Riverside, Calif.). "Surface mount electrical devices and methods" was invented by Kel... Read More


US Patent Issued to L3HARRIS TECHNOLOGIES on June 23 for "Nightvision tube module simplification" (Arizona Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,156, issued on June 23, was assigned to L3HARRIS TECHNOLOGIES INC. (Melbourne, Fla.). "Nightvision tube module simplification" was invented... Read More


US Patent Issued to FEI on June 23 for "Techniques for narrowing zero loss peaks in monochromated charged particles sources" (Dutch Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,157, issued on June 23, was assigned to FEI COMPANY. "Techniques for narrowing zero loss peaks in monochromated charged particles sources" ... Read More


US Patent Issued to JEOL on June 23 for "Charged particle beam source and charged particle beam system" (Japanese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,158, issued on June 23, was assigned to JEOL Ltd. (Tokyo). "Charged particle beam source and charged particle beam system" was invented by ... Read More


US Patent Issued to Carl Zeiss MultiSEM on June 23 for "Multi-beam particle beam system" (German Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,159, issued on June 23, was assigned to Carl Zeiss MultiSEM GmbH (Oberkochen, Germany). "Multi-beam particle beam system" was invented by D... Read More


US Patent Issued to Fractilia on June 23 for "System and method for generating and analyzing roughness measurements and their use for process monitoring and control" (Texas Inventor)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,160, issued on June 23, was assigned to Fractilia LLC (Austin, Texas). "System and method for generating and analyzing roughness measuremen... Read More


US Patent Issued to Hitachi High-Tech on June 23 for "Charged particle beam system" (Japanese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,161, issued on June 23, was assigned to Hitachi High-Tech Corp. (Tokyo). "Charged particle beam system" was invented by Heita Kimizuka (Tok... Read More